Johns Hopkins University
Associate Director of Electron Microscopy
Johns Hopkins University, Baltimore, Maryland, United States, 21276
Johns Hopkins University: Whiting School of Engineering: Department of Materials Science and EngineeringLocationOpen DateMar 31, 2023
DescriptionWe are seeking a high-level electron microscopist who will provide scientific support to the Materials Characterization Processing (MCP) Core Facility in the Department of Materials Science and Engineering (DMSE), Whiting School of Engineering. The position represents the lead electron microscopist for the Center for Intelligent Microscopy — a Center of Excellence in partnership with JEOL Ltd. focused on integration of AI/ML with cutting-edge stimulus, controls and automation platforms in TEM and SEM. The position will report to the Director of the MCP, and the Director of Operations of the MCP, and will also involve outward-facing activities with the broader Johns Hopkins University, including the School of Medicine, as well as the international electron microscopy community. This is a non-tenure track faculty position of the DMSE funded at 80% FTE allowing for 20% to be accrued through personal or collaborative research projects.
The successful candidate will establish the two new JEOL TEMs, a Grand ARM II and a F200, both equipped with EELS, dual EDS, precession electron diffraction, direct electron detectors, IDES laser and beam manipulation, in situ holders, tomography and cryo He holder. These scopes are located in the brand new state-of-the-art MCP facility in the historic Stieff Silver Building. The MCP is a fully integrated facility designed for automated environmental lab control to guarantee machine performance, and full high-speed data connectivity at the instrument to cross-campus levels. We are looking for a microscopist who will help define how microscopy is done in the future. There will also be plenty of opportunities to participate in cutting-edge university, government and industry research.
Specific Duties & Responsibilities: 80%
Be the main TEM microscopist responsible for maintaining, operating and training of the JEOL scopes
Interface with JEOL service and scientists in developing EDGE computing, AI and ML advancements
Guide research directions in TEM applications with faculty, students and outside users
Collaborate or assist in ongoing research with JHU, outside university, government and industrial users
Teach new users and mentor the progression of student knowledge base
Oversee demonstrations, workshops, etc.
Specific Duties & Responsibilities: 20%
Establish your own research projects as PI.
Collaborate as Co-PI on grants.
Participate in the national and international microscopy community.
Qualifications
Several years experience with aberration-corrected microscopy
Extensive knowledge in:
Atomic resolution imaging (HRTEM and STEM) and 4-D imaging methods
Electron diffraction analysis, including scanning precession electron diffraction
Analytical transmission electron microscopy tools, including EELS and EDS
Working knowledge of:
Electron tomography and in situ/operando sample holders
Scanning electron microscopy and focused ion beam
Desire and ability to teach microscopy techniques and theory to students, faculty and other researchers
Ability to interface with other staff toward interdisciplinary technical goals
Application ProcessThis institution is using Interfolio's Faculty Search to conduct this search. Applicants to this position receive a free Dossier account and can send all application materials, including confidential letters of recommendation, free of charge.
The Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students. To that end, the university does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status or other legally protected characteristic. The university is committed to providing qualified individuals access to all academic and employment programs, benefits and activities on the basis of demonstrated ability, performance and merit without regard to personal factors that are irrelevant to the program involved.
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DescriptionWe are seeking a high-level electron microscopist who will provide scientific support to the Materials Characterization Processing (MCP) Core Facility in the Department of Materials Science and Engineering (DMSE), Whiting School of Engineering. The position represents the lead electron microscopist for the Center for Intelligent Microscopy — a Center of Excellence in partnership with JEOL Ltd. focused on integration of AI/ML with cutting-edge stimulus, controls and automation platforms in TEM and SEM. The position will report to the Director of the MCP, and the Director of Operations of the MCP, and will also involve outward-facing activities with the broader Johns Hopkins University, including the School of Medicine, as well as the international electron microscopy community. This is a non-tenure track faculty position of the DMSE funded at 80% FTE allowing for 20% to be accrued through personal or collaborative research projects.
The successful candidate will establish the two new JEOL TEMs, a Grand ARM II and a F200, both equipped with EELS, dual EDS, precession electron diffraction, direct electron detectors, IDES laser and beam manipulation, in situ holders, tomography and cryo He holder. These scopes are located in the brand new state-of-the-art MCP facility in the historic Stieff Silver Building. The MCP is a fully integrated facility designed for automated environmental lab control to guarantee machine performance, and full high-speed data connectivity at the instrument to cross-campus levels. We are looking for a microscopist who will help define how microscopy is done in the future. There will also be plenty of opportunities to participate in cutting-edge university, government and industry research.
Specific Duties & Responsibilities: 80%
Be the main TEM microscopist responsible for maintaining, operating and training of the JEOL scopes
Interface with JEOL service and scientists in developing EDGE computing, AI and ML advancements
Guide research directions in TEM applications with faculty, students and outside users
Collaborate or assist in ongoing research with JHU, outside university, government and industrial users
Teach new users and mentor the progression of student knowledge base
Oversee demonstrations, workshops, etc.
Specific Duties & Responsibilities: 20%
Establish your own research projects as PI.
Collaborate as Co-PI on grants.
Participate in the national and international microscopy community.
Qualifications
Several years experience with aberration-corrected microscopy
Extensive knowledge in:
Atomic resolution imaging (HRTEM and STEM) and 4-D imaging methods
Electron diffraction analysis, including scanning precession electron diffraction
Analytical transmission electron microscopy tools, including EELS and EDS
Working knowledge of:
Electron tomography and in situ/operando sample holders
Scanning electron microscopy and focused ion beam
Desire and ability to teach microscopy techniques and theory to students, faculty and other researchers
Ability to interface with other staff toward interdisciplinary technical goals
Application ProcessThis institution is using Interfolio's Faculty Search to conduct this search. Applicants to this position receive a free Dossier account and can send all application materials, including confidential letters of recommendation, free of charge.
The Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students. To that end, the university does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status or other legally protected characteristic. The university is committed to providing qualified individuals access to all academic and employment programs, benefits and activities on the basis of demonstrated ability, performance and merit without regard to personal factors that are irrelevant to the program involved.
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